Scanning Probe Microscopy - Electrical and Electromechanical Phenomena at the Nanoscale

von: Sergei V. Kalinin, Alexei Gruverman

Springer-Verlag, 2007

ISBN: 9780387286686 , 980 Seiten

Format: PDF

Kopierschutz: Wasserzeichen

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Preis: 309,23 EUR

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Scanning Probe Microscopy - Electrical and Electromechanical Phenomena at the Nanoscale


 

This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.